Doktorské projekty

Mikroelektronika a technologie

Bláha, M. Introduction of Quantum Dots
Bocek, P., Štafl, J. Current Distribution over the Plate Surface In-Lead-Acid Cell in the Course of Discharge
Brzokoupil, V. Utilization of Noise Characteristic for Quality Check of Solar Cells
Bulva, J. Influence of Solder Joint Height to Internal Stress in Multisubstrate Structure
Černoch, P. Electron Trajectories Simulation in Secondary Electrons Scintillation Detector for ESEM
Daněk, L. Calibration of the Deflection Field of the Lithograph Using SEM Mode
El-Fakhri, S. Dielectric Properties of Butadiene Oligomers
Frank, P. Uncertainty in Projecting of Confirmation System in Laboratory Testing
Frk, M., Kameník, R. Dielectric Spectra of High-Up Temperature MICA-Based Insulators
Haman, M. Monitoring of Changes Batteries Mass at Fast Charging Ni-MH Batterries
Hefner, Š., Sedlák, P. Methods for Nonlinear Ultrasonic Spectroscopy
Kadlec, J. Control Board for Cathode Etching
Kameník, R., Frk, M. Relaxation Effects in Dielectric Spectra of Oligomer Materials
Khateb, A. Operational Amplifier Noise Measurements
Khateb, A. Rail-To-Rail Operational Amplifier
Khateb, A., Moualla, F. Noise Models for FET Transistor
Khatib, S. The Defibrillator
Kocian, M. Gel Supercapacitors of Double Layer Type
Krejza, O. Conductivity of Gel Polymer Electrolytes
Matoušek, V., Buchta, Z. A New Method for Direct Measurement of Refraction Index of Air with an Optical Resonator
Matoušek, V., Daněk, L. A Scientific Development System for the Measurement and Generation of Low Frequency Signals
Mika, F. Quantitative Profiling of Dopant Concentration in Semiconductor by Secondary Electron Emission
Nečesal, P. Lithium Batteries
Neděla, V. Physical Conditions and Their Influence on Degradation of Wet Specimens in ESEM
Ondruch, V. Enzyme Activity Characterization by Electrochemical Sensor
Otevřelová, D. Facet Reflectivity of Waveguides Buried at Realistic Depth
Sedlák, P., Hefner, Š. Piezoelectric Sensors: Basic Models
Skřivánek, J. Scintillation Detector for Environmental SEM
Smékal, K. The Analysis of the Dissociation Products of SF6 Formed by the Electrical Discharge
Sutorý, T. MOS Capacitors
Šteffan, P. New Measurement Methods In Virtual Laboratory
Wandrol, P. Detection of Backscattered Electrons in Low Voltage Scanning Electron Microscope
 


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